Instrument Description
Type:
Material Characterization
Make:
J.A. Woollam
Model:
M-2000U
Manufacturer URL:
J.A. Woollam M-2000U Ellipsometer
J.A. Woollam M-2000U Ellipsometer
Usage Info
Availability:
Internal and external researchers
Internal and external researchers
Training Requirements:
Request training via iLab.
*Safety related prerequisite trainings may be required.
Request training via iLab.
*Safety related prerequisite trainings may be required.
SRA-approved rates:
Yes
Yes
Location
Campus:
Evansdale
College:
Benjamin M. Statler College of Engineering and Mineral Resources
Department:
WVU SRF
Address:
Engineering Research Building 211
J.A. Woollam M-2000U Ellipsometer
The J.A. Woollam M-2000U Ellipsometer is used For characterizing film thickness with Angstrom accuracy and determining optical constant of materials.
Capabilities/Specifications
- Spectrum range of 245 to 1000 nm (470 wavelengths)
- 45° to 90° angle of incidence manual angular stage
- Stage mapping of thin film uniformity
- Multiple layer and surface roughness modeling
- Focusing lens attachment for measuring micron thin films
- Samples up to 300 mm in diameter and 20 mm in thickness