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Instrument Description

Type:
Material Characterization
Make:
Dektak
Model:
XT
Manufacturer URL:
Dektak Stylus Profilometer

Usage Info

Availability:
Internal and external researchers
Training Requirements:
Request training via iLab.
*Safety related prerequisite trainings may be required.
SRA-approved rates:
Yes

Location

Campus:
Downtown
College:
Benjamin M. Statler College of Engineering and Mineral Resources
Department:
WVU SRF
Address:
Engineering Sciences Building G75B (Cleanroom)

Dektak Stylus Profilometer

The Dektak Stylus Profilometer is used for the characterization of film thickness, roughness and 3D mapping of samples.

Capabilities/Specifications

  • Nanometer resolution
  • Average step height  and roughness measurements
  • Capable of scanning small pieces to 6" samples
  • Maximum X-Y Translation of 50.8 mm
  • Scan range length of 152 mm
  • Capable of 3D mapping
  • Available styluses: 2 µm B-Type and 12.5 µm Red/White

Contact

Harley Hart

Trieu Nguyen

(916) 532-4710

Trieu.nguyen@mail.wvu.edu

ESB G60 | WH 409