Instrument Description
Type:
Material Characterization
Make:
Dektak
Model:
XT
Manufacturer URL:
Dektak Stylus Profilometer
Dektak Stylus Profilometer
Usage Info
Availability:
Internal and external researchers
Internal and external researchers
Training Requirements:
Request training via iLab.
*Safety related prerequisite trainings may be required.
Request training via iLab.
*Safety related prerequisite trainings may be required.
SRA-approved rates:
Yes
Yes
Location
Campus:
Downtown
College:
Benjamin M. Statler College of Engineering and Mineral Resources
Department:
WVU SRF
Address:
Engineering Sciences Building G75B (Cleanroom)
Dektak Stylus Profilometer
The Dektak Stylus Profilometer is used for the characterization of film thickness, roughness and 3D mapping of samples.
Capabilities/Specifications
- Nanometer resolution
- Average step height and roughness measurements
- Capable of scanning small pieces to 6" samples
- Maximum X-Y Translation of 50.8 mm
- Scan range length of 152 mm
- Capable of 3D mapping
- Available styluses: 2 µm B-Type and 12.5 µm Red/White