Instrument Description
Type:
Microscopy
Make:
Hitachi
Model:
Hitachi S-4700
Manufacturer URL:
Hitachi S-4700 Scanning Electron Microscope
Hitachi S-4700 Scanning Electron Microscope
Usage Info
Availability:
Internal and external researchers
Internal and external researchers
Training Requirements:
Request training via iLab.
*Safety related prerequisite trainings may be required.
Request training via iLab.
*Safety related prerequisite trainings may be required.
SRA-approved rates:
Yes
Yes
Location
Campus:
Evansdale
College:
Benjamin M. Statler College of Engineering and Mineral Resources
Department:
WVU SRF
Address:
Engineering Sciences Building B66
Hitachi S-4700 Scanning Electron Microscope
The Hitachi S-4700 Scanning Electron Microscope is used for structural analyses and X-ray mapping studies.
Capabilities/Specifications
- High resolution and fast data collection
- Multiple holders for a wild range of samples
- EDAX EDS system for elemental analyses
- EDS mapping capability
- EDS Phase mapping capability