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Instrument Description

Type:
Microscopy
Make:
JEOL
Model:
JSM-7600F

Usage Info

Availability:
Internal and external researchers
Training Requirements:
Request training via iLab.
*Safety related prerequisite trainings may be required.
SRA-approved rates:
Yes

Location

Campus:
Evansdale
College:
Benjamin M. Statler College of Engineering and Mineral Resources
Department:
WVU SRF
Address:
Engineering Sciences Building G75B (Cleanroom)

JEOL JSM-7600F Scanning Electron Microscope

The JEOL JSM-7600F Scanning Electron Microscope is a thermal Field Emission SEM for ultra high resolution imaging. In addition, the JSM-7600F incorporates a large specimen chamber. This uniquely designed chamber, which accommodates a 200 mm diameter specimen, is optimized for a large variety of detectors for secondary electrons, back-scattered electrons, etc. 

Capabilities/Specifications

  • NPGS lithography software
  • Accelerating Voltage of 0.1 to 30 kV
  • Magnification range from 25 to 1,000,000´
  • Sample up to 4 inch diameter

Contact