Instrument Description
Type:
Microscopy
Make:
JEOL
Model:
JSM-7600F
Manufacturer URL:
JEOL JSM-7600F Scanning Electron Microscope
JEOL JSM-7600F Scanning Electron Microscope
Usage Info
Availability:
Internal and external researchers
Internal and external researchers
Training Requirements:
Request training via iLab.
*Safety related prerequisite trainings may be required.
Request training via iLab.
*Safety related prerequisite trainings may be required.
SRA-approved rates:
Yes
Yes
Location
Campus:
Evansdale
College:
Benjamin M. Statler College of Engineering and Mineral Resources
Department:
WVU SRF
Address:
Engineering Sciences Building G75B (Cleanroom)
JEOL JSM-7600F Scanning Electron Microscope
The JEOL JSM-7600F Scanning Electron Microscope is a thermal Field Emission SEM for ultra high resolution imaging. In addition, the JSM-7600F incorporates a large specimen chamber. This uniquely designed chamber, which accommodates a 200 mm diameter specimen, is optimized for a large variety of detectors for secondary electrons, back-scattered electrons, etc.
Capabilities/Specifications
- NPGS lithography software
- Accelerating Voltage of 0.1 to 30 kV
- Magnification range from 25 to 1,000,000´
- Sample up to 4 inch diameter