Instrument Description
Type:
Material Characterization
Make:
Bruker
Model:
Discover D8
Manufacturer URL:
Bruker D8 Discover X-ray Diffractometer
Bruker D8 Discover X-ray Diffractometer
Usage Info
Availability:
Internal and external researchers
Internal and external researchers
Training Requirements:
Request training via iLab.
*Safety related prerequisite trainings may be required.
Request training via iLab.
*Safety related prerequisite trainings may be required.
SRA-approved rates:
Yes
Yes
Location
Campus:
Downtown
College:
Benjamin M. Statler College of Engineering and Mineral Resources
Department:
WVU SRF
Address:
Engineering Research Building 211
Bruker D8 Discover X-ray Diffractometer
The Bruker D8 Discover X-ray Diffractometer (XRD) is used for determining the crystal structure of solids, powders and thin films and for reciprocal space mapping of crystalline materials and 2D mapping of wafers.
Capabilities/Specifications
- Cu-kα1 8047.2 eV source
- Maximum X-Ray power of 40 kV and 40 mA
- 360° angular range with a maximum user range of -100° < 2θ < 169°
- Leptos analysis software
- 1 inch hot stage from ambient to 900 °C
- 1 inch sample clip stage
- 5 inch vacuum stage
- Powders, thin films or bulk materials